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Device testing represents the single largest manufacturing expense in the semiconductor industry. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors takethe reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault modes, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
AUTEUR: Sandeep Gupta
NOM DE FICHIER: Testing of Digital Systems.pdf
DATE DE PUBLICATION: 2003-Jan-01
TAILLE DU FICHIER: 4,46 MB